AP54RHC506

Radiation Hardened 5-Channel Bus Transceiver

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Datasheets

Product Overview

The AP54RHC506 is a radiation-hardened by design 5- bit bus transceiver with 3-state outputs that is ideally suited for space, medical imaging, high-energy physics and other applications demanding radiation tolerance and high reliability. It is fabricated in a 180 nm CMOS process utilizing proprietary radiation-hardening techniques, delivering high resiliency to single-event effects (SEE) and to a total ionizing dose (TID) up to 30 krad (Si).

This device is a member of the Apogee Semiconductor AP54RHC logic family operating across a voltage supply range of 1.65 V to 5.5 V.

An output enable control pin allows all buff­ers to be placed in a high impedance (high-Z) state, simplifying usage in applications with shared busses or mixed power domains. A direction control pin is used to determine whether data flow is A→B or B→A.

Zero-power penalty cold-sparing is supported, along with Class 2 ESD protection on all inputs and outputs. A proprietary output stage and robust power-on reset (POR) circuit allow the AP54RHC506 to be cold-spared in any redundant configuration with no static power loss on any pad of the device. The redundant output stage also features a high drive capability with low static power loss.

The AP54RHC506 also features a triple-redundant design throughout its entire circuitry, which allows it to be immune to single-event transients (SET) without requiring additional redundant devices.

  • 1.65 VDC to 5 VDC operation
  • Inputs tolerant up to 5.5 VDC at any VCC
  • Provides logic-level down translation to VCC
  • Extended operating temperature range (-55°C to +125°C)
  • Proprietary cold-sparing capability with zero static power penalty
  • Built-in triple redundancy for enhanced reliability
  • Internal low-loss power-on reset (POR) circuitry ensures reliable power up and power down responses during hot plug and cold sparing operations
  • Class 2 ESD protection (4000 V HBM, 500 V CDM)
  • TID resilience of 30 krad (Si) or 300 krad (Si)
  • SEL resilient up to LET 80 MeV-cm2/mg
  • LEO Constellations
  • Small satellites
  • Medical Imaging

Order

Part
Number
Pedigree Package Pins Burn-In Lead
Finish
TID
kRad (Si)
SEL
MeV/mg/cm2
RFQ Purchase
AP54RHC506ELT Evaluation TSSOP 14 No SnPb 30 80 Contact Us

AP54RHC506BLT Flight TSSOP 14 No SnPb 30 80 Contact Us

AP54RHC506ALT Flight TSSOP 14 Yes SnPb 30 80 Contact Us Contact Us

Development Boards

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