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AP54RHC705
Radiation Hardened’ Dual D Flip-Flop
AP54RHC705
Description
Features & Benefits
Application
The AP54RHC705 is a radiation-hardened-by-design dual D flip flop for space, medical imaging, and high-energy physics applications, built on a 180 nm CMOS process with proprietary hardening for resilience to single-event effects and total ionizing dose up to 30 krad(Si). As a member of Apogee Semiconductor’s AP54RHC logic family, it operates from 1.65 V to 5.5 V supply and uses a fully triple-redundant architecture to provide immunity to single-event transients without external redundancy.
- 1.65 VDC to 5 VDC operation
- Inputs tolerant up to 5.5 VDC at any VCC
- Provides logic-level down translation to VCC
- Extended operating temperature range (-55°C to +125°C)
- Proprietary cold-sparing capability with zero static power penalty
- Built-in triple redundancy for enhanced reliability SEL resilient up to LET 80 MeV-cm2/mg
- LEO Constellations
- Small satellites
- Medical Imaging
- Data Storage
- Data Syncronization
Technical Documentation
Top documentation for this product
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Date
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| Datasheets | AP54RHC705 Radiation-hardened' Dual D Flip Flop With Dice Latches And Cold Sparing | 09/02/2025 | ||
| Report | LEO Single-Supply Total Ionizing Dose (TID) Radiation Test Report | 04/25/2025 | ||
| Report | LEO Dual-Supply Total Ionizing Dose (TID) Radiation Test Report | 04/25/2025 | ||
| Report | Single-Event Effect (SEE) Radiation Test Report | 07/14/2022 | ||
| Report | Single Event Latchup (SEL) Report | 07/14/2022 | ||
| Whitepaper | The Logic of Cold Sparing Enabling Resilient Systems with Advanced Components | 01/03/2024 | ||
| Whitepaper | Limit the Impact of COTS Failures in Commercial Space with Apogee's Relbridge (Co-authored by JPL) | 08/16/2024 | ||
| Quality Document | Product Grades and Quality Flows | 05/12/2025 |
| AP54RHC705 Radiation-hardened' Dual D Flip Flop With Dice Latches And Cold Sparing | Datasheets | 09/02/2025 | |
| LEO Single-Supply Total Ionizing Dose (TID) Radiation Test Report | Report | 04/25/2025 | |
| LEO Dual-Supply Total Ionizing Dose (TID) Radiation Test Report | Report | 04/25/2025 | |
| Single-Event Effect (SEE) Radiation Test Report | Report | 07/14/2022 | |
| Single Event Latchup (SEL) Report | Report | 07/14/2022 | |
| The Logic of Cold Sparing Enabling Resilient Systems with Advanced Components | Whitepaper | 01/03/2024 | |
| Limit the Impact of COTS Failures in Commercial Space with Apogee's Relbridge (Co-authored by JPL) | Whitepaper | 08/16/2024 | |
| Product Grades and Quality Flows | Quality Document | 05/12/2025 |
Design and Development
Top documentation for this product
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| CAD Footprints, Symbols, & 3D Models | AP54RHC705 Schematic Symbol | CAD Model | 07/19/2024 |
| AP54RHC705 Schematic Symbol | CAD Footprints, Symbols, & 3D Models | CAD Model | 19/07/2024 |
ordering
| Part Number | Pedigree | Package | Pins | Lead Finish | MSL Rating | Burn-In | Standard Lead Time (Weeks) | Request Quote |
|---|---|---|---|---|---|---|---|---|
| AP54RHC705ELT-R | Evaluation | TSSOP | 14 | SnPb | 1 | No | 4 |
Micross |
| AP54RHC705CLT-R | Flight Grade C | TSSOP | 14 | SnPb | 1 | No | 6 |
Mouser (Non-Stocked) |
| AP54RHC705BLT-R | Flight Grade B | TSSOP | 14 | SnPb | 1 | No | 7 |
Micross |
| AP54RHC705ALT-R | Flight Grade A | TSSOP | 14 | SnPb | 1 | Yes | 9 |
Micross Mouser |
| AP54RHC705ENT-R | Evaluation | TSSOP | 14 | NiPdAu | 1 | No | 35 |
Contact Us |
| AP54RHC705CNT-R | Flight Grade C | TSSOP | 14 | NiPdAu | 1 | No | 35 |
Contact Us |
| AP54RHC705BNT-R | Flight Grade B | TSSOP | 14 | NiPdAu | 1 | No | 35 |
Contact Us |
| AP54RHC705ANT-R | Flight Grade A | TSSOP | 14 | NiPdAu | 1 | Yes | 35 |
Contact Us |
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