AP54RHC288

Radiation Hardened Two-Channel Dual-Input Arbiter

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Datasheets

Product Overview

The AP54RHC288 is a radiation-hardened by design Two-Channel Dual-Input Arbiter that is ideally suited for space, medical imaging and other applications demanding radiation tolerance and high reliability. It is fabricated in a 180 nm CMOS process utilizing proprietary radiation-hardening techniques, delivering high
resiliency to single-event effects (SEE) and to a total ionizing dose (TID) up to 30 krad (Si).

The AP54RHC288 provides protection for critical applications by ensuring that on each channel only one output can be high, regardless of the signal state at the inputs. This feature is ideal for half-bridge drivers, power supplies, thrusters, and other applications where crossconduction must be avoided. This device is a member of the Apogee Semiconductor AP54RHC logic family operating across a voltage supply range of 1.65 V to 5.5 V.

Zero-power penalty™ cold-sparing is supported, along with Class 2 ESD protection on all inputs and outputs. A proprietary output stage and robust power-on reset (POR) circuit allow the AP54RHC288 to be cold-spared in any redundant configuration with no static power loss on any pad of the device. The redundant output stage also features a high drive capability with low static power loss.

The AP54RHC288 also features a triple-redundant design throughout its entire circuitry, which allows it to be immune to single-event transients (SET) without requiring additional redundant devices.

  • 1.65 VDC to 5.5 VDC operation
  • Inputs tolerant up to 5.5 VDC at any VCC
  • Provides logic-level down translation to VCC
  • Extended operating temperature range (-55 °C to +125 °C)
  • Proprietary cold-sparing capability with zero static power penalty
  • Built-in triple redundancy for enhanced reliability
  • Internal power-on reset (POR) circuitry ensures reliable power up and power down responses during hot plug and cold sparing operations
  • Tri-state output drivers
  • Class 2 ESD protection (4000 V HBM, 500 V CDM)
  • TID resilience of 30 krad (Si)
  • SEL resilient up to LET of 80 MeV-cm2/mg
  • LEO Constellations
  • Small satellites
  • Medical Imaging

Order

Part
Number
Pedigree Package Pins Burn-In Lead
Finish
TID
kRad (Si)
SEL
MeV/mg/cm2
RFQ Purchase
AP54RHC288ELT-W Evaluation TSSOP 14 No SnPb 30 80 Contact Us

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AP54RHC288BLT-R Flight TSSOP 14 No SnPb 30 80 Contact Us

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AP54RHC288ALT-R Flight TSSOP 14 Yes SnPb 30 80 Contact Us Contact Us

Development Boards

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