AF54RHC5942

The AF54RHC5942 is a radiation-hardened by design 8 bit shift register, serial in parallel out, with output latch that is ideally suited for space, medical imaging and other applications demanding radiation tolerance and high reliability. It is fabricated in a 180 nm CMOS process utilizing proprietary radiation-hardening techniques, delivering high resiliency to single-event effects (SEE) and to a total ionizing dose (TID) to 300 krad (Si).

This device is a member of the Apogee Semiconductor AF54RHC logic family operating across a voltage supply range of 1.65 V to 5.5 V.

Zero-power penalty™ cold-sparing is supported, along with Class 2 ESD protection on all inputs and outputs. A proprietary output stage and robust power-on reset (POR) circuit allow the AF54RHC5942 to be cold-spared in any redundant configuration with no static power loss on any pad of the device. The redundant output stage also features a high drive capability with low static power loss.

The AF54RHC5942 also features a triple-redundant design throughout its entire circuitry, which allows it to be immune to single-event transients (SET) without
requiring additional redundant devices.

This device provides eight instances of the Boolean logical function INV (Y = A ).