AF54RHC132

Radiation Hardened Quad Schmitt 2-input NAND Gate

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AF54RHC132

Datasheets

Product Overview

The A54RHC132 is a radiation-hardened by design quad Schmitt 2-input NAND that is ideally suited for space, medical imaging and other applications demanding radiation tolerance and high reliability. It is fabricated in a 180 nm CMOS process utilizing proprietary radiation-hardening techniques, delivering high resiliency to single-event effects (SEE) and to a total ionizing dose (TID) up to 300 krad (Si).

This device is a member of the Apogee Semiconductor A54RHC logic family operating across a voltage supply range of 1.65 V to 5.5 V.

The A54RHC132 features true Schmitt triggers on each of its input buffers, providing hysteresis to accommodate slow-rising or noisy input signals without any input rise or fall-time requirements.

Zero-power permalloy™ cold-sparing is supported, along with Class 2 ESD protection on all inputs and outputs. A proprietary output stage and robust power-on reset (POR) circuit allow the A54RHC132 to be cold-spared in any redundant configuration with no static power loss on any pad of the device. The redundant output stage also features a high drive capability with low static power loss.

The A54RHC132 also features a triple-redundant design throughout its entire circuitry, which allows it to be immune to single-event transients (SET) without requiring additional redundant devices.

This device provides four instances of the Boolean logical function NAND (Y = A · B).

  • 1.65 VDC to 5 VDC operation
  • Inputs tolerant up to 5.5 VDC at any VCC
  • Provides logic-level down translation to VCC
  • Extended operating temperature range (-55°C to +125°C)
  • Proprietary cold-sparing capability with zero static power penalty
  • Built-in triple redundancy for enhanced reliability
  • Internal low-loss power-on reset (POR) circuitry ensures reliable power up and power down responses during hot plug and cold sparing operations
  • Class 2 ESD protection (4000 V HBM, 500 V CDM)
  • TID resilience of 30 krad (Si) or 300 krad (Si)
  • SEL resilient up to LET 80 MeV-cm2/mg
  • LEO Constellations
  • Small satellites
  • Medical Imaging

Order

Part NumberPedigreePackagePinsBurn-InLead FinishTID kRad (Si)SEL MeV/mg/cm2RFQPurchase
AP54RHC132ELTP-WEvaluationTSSOP146.50×5.11×0.94SnPb30080Contact UsContact Us
AP54RHC132ALTP-TFlightTSSOP146.50×5.11×0.94SnPb30080Contact UsContact Us

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