Available Now
AF54RHC164
Radiation Hardened’ 8-bit Shift Register SIPO
AF54RHC164
Description
Features & Benefits
Application
The AF54RHC164 is a radiation-hardened-by-design 8-bit Serial-In Parallel-Out Shift Register (SIPO) for space, medical imaging, and high-energy physics applications, built on a 180 nm CMOS process with proprietary hardening for resilience to single-event effects and total ionizing dose up to 300 krad(Si). As a member of Apogee Semiconductor’s AF54RHC logic family, it operates from 1.65 V to 5.5 V supply and uses a fully triple-redundant architecture to provide immunity to single-event transients without external redundancy.
- 1.65 VDC to 5 VDC operation
- Inputs tolerant up to 5.5 VDC at any VCC
- Provides logic-level down translation to VCC
- Extended operating temperature range (-55°C to +125°C)
- Proprietary cold-sparing capability with zero static power penalty
- Built-in triple redundancy for enhanced reliability SEL resilient up to LET 80 MeV-cm2/mg
- MEO/GEO Satellites
- Nuclear/Medical Imaging
- Data Storage
- Signal Processing
- Digital Communication
- DAC Latch
Technical Documentation
Top documentation for this product
|
|
|
Format |
Date
|
|
| Datasheet | AF54RHC164 Radiation Hardened' 8-bit Serial-In Parallel-Out Shift Register With Cold Sparing | 08/29/2025 | ||
| Report | GEO Single-Supply Total Ionizing Dose (TID) Radiation Test Report | 04/25/2025 | ||
| Report | GEO Dual-Supply Total Ionizing Dose (TID) Radiation Test Report | 04/25/2025 | ||
| Report | Single-Event Effect (SEE) Radiation Test Report | 09/02/2025 | ||
| Whitepaper | The Logic of Cold Sparing Enabling Resilient Systems with Advanced Components | 01/03/2024 | ||
| Whitepaper | Limit the Impact of COTS Failures in Commercial Space with Apogee's Relbridge (Co-authored by JPL) | 08/16/2024 | ||
| Quality Document | Product Grades and Quality Flows | 05/12/2025 |
| AF54RHC164 Radiation Hardened' 8-bit Serial-In Parallel-Out Shift Register With Cold Sparing | Datasheet | 08/29/2025 | |
| GEO Single-Supply Total Ionizing Dose (TID) Radiation Test Report | Report | 04/25/2025 | |
| GEO Dual-Supply Total Ionizing Dose (TID) Radiation Test Report | Report | 04/25/2025 | |
| Single-Event Effect (SEE) Radiation Test Report | Report | 09/02/2025 | |
| The Logic of Cold Sparing Enabling Resilient Systems with Advanced Components | Whitepaper | 01/03/2024 | |
| Limit the Impact of COTS Failures in Commercial Space with Apogee's Relbridge (Co-authored by JPL) | Whitepaper | 08/16/2024 | |
| Product Grades and Quality Flows | Quality Document | 05/12/2025 |
Design and Development
Top documentation for this product
|
|
|
Format |
Date
|
|
| CAD Footprints, Symbols, & 3D Models | AF54RHC164 Schematic Symbol | CAD Model | 07/19/2024 |
| AF54RHC164 Schematic Symbol | CAD Footprints, Symbols, & 3D Models | CAD Model | 19/07/2024 |
ordering
| Part Number | Pedigree | Package | Pins | Lead Finish | MSL Rating | Burn-In | Standard Lead Time (Weeks) | Request Quote |
|---|---|---|---|---|---|---|---|---|
| AF54RHC164ELT-R | Evaluation | TSSOP | 14 | SnPb | 1 | No | 35 |
Contact Us |
| AF54RHC164CLT-R | Flight Grade C | TSSOP | 14 | SnPb | 1 | No | 35 |
Contact Us |
| AF54RHC164BLT-R | Flight Grade B | TSSOP | 14 | SnPb | 1 | No | 35 |
Contact Us |
| AF54RHC164ALT-R | Flight Grade A | TSSOP | 14 | SnPb | 1 | Yes | 35 |
Contact Us |
| AF54RHC164ENT-R | Evaluation | TSSOP | 14 | NiPdAu | 1 | No | 4 |
Mouser Arrow |
| AF54RHC164CNT-R | Flight Grade C | TSSOP | 14 | NiPdAu | 1 | No | 6 |
Mouser (Non-Stocked) Arrow |
| AF54RHC164BNT-R | Flight Grade B | TSSOP | 14 | NiPdAu | 1 | No | 7 |
Arrow |
| AF54RHC164ANT-R | Flight Grade A | TSSOP | 14 | NiPdAu | 1 | Yes | 9 |
Mouser (Non-Stocked) Arrow |
Related Products
ENGINEERED FOR MISSION
Mission-ready technologies powering space and defense systems. Explore our product portfolio or connect with an authorized distributor to get started.