AP54RHC420
Radiation-Hardened Dual Quad-SR Latch
AP54RHC420
The AP54RHC420 is a radiation-hardened by design dual quad-SR latch that is ideally suited for commercial space and other applications demanding radiation tolerance and high reliability. The AP54RHC420 enables use of COTS components that have low radiation resilience via SEE fault detection, including the ability to capture very-fast 5 ns faults. Its inputs can be cross strapped for easy cold sparing at no power penalty. The AP54RHC420 is inherently fault free and thus can be relied on to only detect true system failures or fault events. It can be used with the APIO16 I/O expander for scalable multi-channel fault detection.Â
- 5 ns transient detection at VCC > 3 VÂ
- SEL/SEFI/SET immune to LET of 75 MeV-cm2/mgÂ
- 1.4 V to 5.5 V operationÂ
- Schmitt triggers on inputsÂ
- Cold sparing Inputs and OutputsÂ
- Single-supply Level TranslationÂ
- TID RLAT 30 krad (Si) at 5.5 VÂ
- Operating temperature range -55 °C to +125 °CÂ
- Meets NASA’s ASTM E595 outgassing specificationÂ
- Moisture Sensitivity Level 1 (Unlimited)
- System-level glitch latching
- Power supply transient detection
- FDIR: Fault Detection, Isolation, and Recovery
- Single-bit latching
- Discrete state machines
- SEE fault detection in non-rad hard components
Technical Documentation
Top documentation for this product
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| Datasheet | AP54RHC420 Radiation-Hardened Dual Quad-SR Latch with Cold Sparing and Schmitt Trigger Inputs | 05/06/2026 | ||
| Product Flyer | AP54RHC420 Overview | 04/22/2026 | ||
| Report | AP54RHC420 Material Content Report | 08/15/2024 | ||
| Report | Single-Event Effects (SEE) Radiation Report (GF Foundry) | 05/29/2026 | ||
| Report | LEO Single-Supply Total Ionizing Dose (TID) Radiation Report (GF Foundry) | 05/19/2026 | ||
| Product Brochure | Apogee Semiconductor Product Catalog 2026 | 04/13/2026 | ||
| White Paper | The Logic of Cold Sparing Enabling Resilient Systems with Advanced Components | 01/03/2024 | ||
| White Paper | Limit the Impact of COTS Failures in Commercial Space with Apogee’s Relbridge (Co-authored by JPL) | 08/16/2024 | ||
| Application Note | Product Grades and Quality Flows | 03/04/2025 |
| AP54RHC420 Radiation-Hardened Dual Quad-SR Latch with Cold Sparing and Schmitt Trigger Inputs | Datasheet | 05/06/2026 | |
| AP54RHC420 Overview | Product Flyer | 04/22/2026 | |
| AP54RHC420 Material Content Report | Report | 08/15/2024 | |
| Single-Event Effects (SEE) Radiation Report (GF Foundry) | Report | 05/29/2026 | |
| LEO Single-Supply Total Ionizing Dose (TID) Radiation Report (GF Foundry) | Report | 05/19/2026 | |
| Apogee Semiconductor Product Catalog 2026 | Product Brochure | 04/13/2026 | |
| The Logic of Cold Sparing Enabling Resilient Systems with Advanced Components | White Paper | 01/03/2024 | |
| Limit the Impact of COTS Failures in Commercial Space with Apogee’s Relbridge (Co-authored by JPL) | White Paper | 08/16/2024 | |
| Product Grades and Quality Flows | Application Note | 03/04/2025 |
Design and Development
Top documentation for this product
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| CAD Footprints, Symbols, & 3D Models | AP54RHC420 Schematic Symbol, Footprint, and 3D Model | CAD Model | 04/21/2026 |
| AP54RHC420 Schematic Symbol, Footprint, and 3D Model | CAD Footprints, Symbols, & 3D Models | CAD Model | 21/04/2026 |
ordering
| Part Number | Pedigree | Package | Pins | Lead Finish | MSL Rating | Burn-In | Standard Lead Time (Weeks) | Request Quote |
|---|---|---|---|---|---|---|---|---|
| AP54RHC420ENT-R | Evaluation | TSSOP-20 | 20 | NiPdAu | 1 | No | 4 |
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| AP54RHC420CNT-R | Flight Grade C | TSSOP-20 | 20 | NiPdAu | 1 | No | 6 |
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| AP54RHC420BNT-R | Flight Grade B | TSSOP-20 | 20 | NiPdAu | 1 | No | 7 |
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| AP54RHC420ANT-R | Flight Grade A | TSSOP-20 | 20 | NiPdAu | 1 | Yes | 9 |
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