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APIO16/AFIO16
Radiation Hardened level translating I²C, SMBUS, SPI 16-bit I/O expander family
APIO16/AFIO16
Description
Features & Benefits
Application
The AxIO16 is a radiation-hardened by design level translating I2C, SMBUS, SPI I/O expander family that is ideally suited for space, medical imaging and other applications demanding radiation tolerance and high reliability. It is fabricated in a BiCMOS process utilizing proprietary radiation-hardening techniques, delivering high resiliency to single-event effects (SEE) and to a total ionizing dose (TID) as might be found in both Low Earth Orbit (LEO) and Geostationary Earth Orbit (GEO) environments.
- Supports SPI (25MHz) and I2C (1MHz) / SMBUS
- Interface rail (VCCI) and Port rail (VCCP) operating from 1.4V to 5.5V
- Level Translation
- Internal power-on reset (POR)
- Open drain INTB pin to alert controller when inputs change
- Cold sparable I/Os with zero power penalty
- Built-in triple redundancy
- TID resilience: 30krad (Si) and 300krad (Si) variants
- SEL/SEU/SEFI immune up to LET of 75 MeV-cm²/mg
- 4 address pins yielding 16 unique I2C addresses
- 6 SEU Immune 8-bit data registers
- Flexible fast comms interface
- Built-in up/down level translation suitable for modern FPGAs (XPIO)
- Enables below-rated voltage of COTS FPGAs to mitigate SEL sensitivity
- Ensures reliable power up and power down responses during hot plug and cold sparing operations
- Fault detection and containment
- Simplifies cold sparing implementations
- Radiation-hardened against Single Event Effect (SEE)
- Suitable solutions for both LEO and GEO missions
- Allows up to 256 control channels on one 2-wire I2C bus
- Enables up to 768 bits of critical system data storage on a single I2C bus
- Expand number of I/O’s for MCUs and FPGAs
- Voltage level translation between legacy peripherals and modern FPGAs
- Health monitoring for remote systems
- Serialize peripheral monitoring signals
- Reduce harness size and weight
- Cold sparable IOs for primary redundant systems
- Wake from Interrupt (WFI) automatic processor reactivation
- Power sequencing and fault detection by monitoring power good signals
- Dynamic Voltage Scaling (DVS) with real-time power rail adjustments
- Phased-Array antenna element control
- Preserve mission critical information in power-cycled systems with rad-hard memory storage
- Basic ADCs and DACs
Technical Documentation
Top documentation for this product
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Format |
Date
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| Datasheets | APIO16/AFIO16 Radiation Hardened 16-bit level translating I²C, SMBUS, SPI IO expander | 05/06/2025 | ||
| Reports | APIO16 Total Ionizing Dose (TID) Radiation Test Report | 05/23/2025 | ||
| Reports | AFIO16 Total Ionizing Dose (TID) Radiation Test Report | 02/04/2026 | ||
| Reports | AxIO16 Single-Event Effect (SEE) Radiation Test Report | 05/23/2025 | ||
| Product Flyer | APIO16/AFIO16 Overview | 05/23/2025 | ||
| Application Note | APIO16-AFIO16: Practical Applications in Control Sensing and Power Management | 05/23/2025 | ||
| Reports | APIO16/AFIO16 Material Content Report | 11/06/2025 | ||
| Product Brochure | Apogee Semiconductor Product Catalog 2025 | 05/23/2025 | ||
| White Paper | The Logic of Cold Sparing Enabling Resilient Systems with Advanced Components | 05/23/2025 | ||
| White Paper | Limit the Impact of COTS Failures in Commercial Space with Apogee’s Relbridge (Co-authored by JPL) | 05/23/2025 | ||
| Quality | Product Grades and Quality Flows | 06/11/2025 |
| APIO16/AFIO16 Radiation Hardened 16-bit level translating I²C, SMBUS, SPI IO expander | Datasheets | 05/06/2025 | |
| APIO16 Total Ionizing Dose (TID) Radiation Test Report | Reports | 05/23/2025 | |
| AFIO16 Total Ionizing Dose (TID) Radiation Test Report | Reports | 02/04/2026 | |
| AxIO16 Single-Event Effect (SEE) Radiation Test Report | Reports | 05/23/2025 | |
| APIO16/AFIO16 Overview | Product Flyer | 05/23/2025 | |
| APIO16-AFIO16: Practical Applications in Control Sensing and Power Management | Application Note | 05/23/2025 | |
| APIO16/AFIO16 Material Content Report | Reports | 11/06/2025 | |
| Apogee Semiconductor Product Catalog 2025 | Product Brochure | 05/23/2025 | |
| The Logic of Cold Sparing Enabling Resilient Systems with Advanced Components | White Paper | 05/23/2025 | |
| Limit the Impact of COTS Failures in Commercial Space with Apogee’s Relbridge (Co-authored by JPL) | White Paper | 05/23/2025 | |
| Product Grades and Quality Flows | Quality | 06/11/2025 |
Design and Development
Top documentation for this product
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Date
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| Hardware | APIO16-EVB Evaluation Board (EVB) User’s Guide | 05/23/2025 | ||
| Hardware | APIO16-EVB EU Declaration of Conformity (DoC) | 05/23/2025 | ||
| Model | AxIO16 I²C QSPICE User’s Guide | 10/24/2025 | ||
| Model | AxIO16 I²C QSPICE Simulation Testbench | ZIP | 10/24/2025 | |
| Model | AxIO16 IBIS Model | ZIP | 02/26/2026 | |
| CAD Footprints, Symbols, & 3D Models | APIO16 Schematic Symbol, Footprint, and 3D Model | CAD Model | 05/24/2025 | |
| CAD Footprints, Symbols, & 3D Models | AFIO16 Schematic Symbol, Footprint, and 3D Model | CAD Model | 10/03/2025 |
| APIO16-EVB Evaluation Board (EVB) User’s Guide | Hardware | 23/05/2025 | |
| APIO16-EVB EU Declaration of Conformity (DoC) | Hardware | 23/05/2025 | |
| AxIO16 I²C QSPICE User’s Guide | Model | 24/10/2025 | |
| AxIO16 I²C QSPICE Simulation Testbench | Model | ZIP | 24/10/2025 |
| AxIO16 IBIS Model | Model | ZIP | 26/02/2026 |
| APIO16 Schematic Symbol, Footprint, and 3D Model | CAD Footprints, Symbols, & 3D Models | CAD Model | 24/05/2025 |
| AFIO16 Schematic Symbol, Footprint, and 3D Model | CAD Footprints, Symbols, & 3D Models | CAD Model | 03/10/2025 |
APIO16-EVB Top and Bottom Side Pictures
ordering
| Part Number | Pedigree | Package | Pins | Lead Finish | MSL Rating | Burn-In | Standard Lead Time (Weeks) | Request Quote |
|---|---|---|---|---|---|---|---|---|
| APIO16ENT-R | Evaluation | TSSOP | 28 | NiPdAu | 1 | No | 4 |
Mouser |
| APIO16ANT-R | Flight Grade A | TSSOP | 28 | NiPdAu | 1 | Yes | 9 |
Mouser (Non-Stocked) |
| APIO16BNT-R | Flight Grade B | TSSOP | 28 | NiPdAu | 1 | No | 7 |
Mouser (Non-Stocked) |
| APIO16CNT-R | Flight Grade C | TSSOP | 28 | NiPdAu | 1 | No | 6 |
Mouser (Non Stocked) |
| APIO16-EVB | Evaluation | EVB | 28 | NiPdAu | 1 | No | 8 |
Contact Us |
| AFIO16ENT-R | Evaluation | TSSOP | 28 | NiPdAu | 1 | No | 4 |
Mouser (Non-Stocked) |
| AFIO16ANT-R | Flight Grade A | TSSOP | 28 | NiPdAu | 1 | Yes | 9 |
Mouser (Non-Stocked) |
| AFIO16BNT-R | Flight Grade B | TSSOP | 28 | NiPdAu | 1 | No | 7 |
Mouser (Non-Stocked) |
| AFIO16CNT-R | Flight Grade C | TSSOP | 28 | NiPdAu | 1 | No | 6 |
Mouser (Non-Stocked) |
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